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doi:10.22028/D291-35133 | Title: | Introduction to the Proceedings of CISCEM 2021 - the 5th Conference on In-Situ and Correlative Electron Microscopy |
| Author(s): | Alloyeau, Damien Mølhave, Kristian S. de Jonge, Niels |
| Language: | English |
| Title: | Microscopy and microanalysis : the official journal of the Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada |
| Volume: | 27 |
| Issue: | S2 |
| Startpage: | 1 |
| Endpage: | 2 |
| Publisher/Platform: | Cambridge University Press |
| Year of Publication: | 2021 |
| Publikation type: | Journal Article |
| DOI of the first publication: | 10.1017/S1431927621013003 |
| URL of the first publication: | https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/introduction-to-the-proceedings-of-ciscem-2021-the-5th-conference-on-insitu-and-correlative-electron-microscopy/FA944669F9FED409C1545DAED6091886 |
| Link to this record: | hdl:20.500.11880/32060 http://dx.doi.org/10.22028/D291-35133 |
| ISSN: | 1435-8115 1431-9276 |
| Date of registration: | 20-Dec-2021 |
| Faculty: | NT - Naturwissenschaftlich- Technische Fakultät |
| Department: | NT - Physik |
| Professorship: | NT - Keiner Professur zugeordnet |
| Collections: | SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
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