Please use this identifier to cite or link to this item: doi:10.22028/D291-35133
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Title: Introduction to the Proceedings of CISCEM 2021 - the 5th Conference on In-Situ and Correlative Electron Microscopy
Author(s): Alloyeau, Damien
Mølhave, Kristian S.
de Jonge, Niels
Language: English
Title: Microscopy and microanalysis : the official journal of the Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume: 27
Issue: S2
Startpage: 1
Endpage: 2
Publisher/Platform: Cambridge University Press
Year of Publication: 2021
Publikation type: Journal Article
DOI of the first publication: 10.1017/S1431927621013003
URL of the first publication: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/introduction-to-the-proceedings-of-ciscem-2021-the-5th-conference-on-insitu-and-correlative-electron-microscopy/FA944669F9FED409C1545DAED6091886
Link to this record: hdl:20.500.11880/32060
http://dx.doi.org/10.22028/D291-35133
ISSN: 1435-8115
1431-9276
Date of registration: 20-Dec-2021
Faculty: NT - Naturwissenschaftlich- Technische Fakultät
Department: NT - Physik
Professorship: NT - Keiner Professur zugeordnet
Collections:Die Universitätsbibliographie

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