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doi:10.22028/D291-29265 | Title: | Introduction to the Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy |
| Author(s): | de Jonge, Niels Mølhave, Kristian Alloyeau, Damien |
| Language: | English |
| Title: | Microscopy and Microanalysis |
| Volume: | 25 |
| Issue: | S1 |
| Startpage: | 1 |
| Endpage: | 2 |
| Publisher/Platform: | Cambridge University Press |
| Year of Publication: | 2019 |
| Publikation type: | Journal Article |
| DOI of the first publication: | 10.1017/S1431927618015763 |
| Link to this record: | hdl:20.500.11880/28140 http://dx.doi.org/10.22028/D291-29265 |
| ISSN: | 1435-8115 1431-9276 |
| Date of registration: | 21-Oct-2019 |
| Faculty: | NT - Naturwissenschaftlich- Technische Fakultät |
| Department: | NT - Physik |
| Professorship: | NT - Keiner Professur zugeordnet |
| Collections: | SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
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