Please use this identifier to cite or link to this item: doi:10.22028/D291-29265
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Title: Introduction to the Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy
Author(s): de Jonge, Niels
Mølhave, Kristian
Alloyeau, Damien
Language: English
Title: Microscopy and Microanalysis
Volume: 25
Issue: S1
Startpage: 1
Endpage: 2
Publisher/Platform: Cambridge University Press
Year of Publication: 2019
Publikation type: Journal Article
DOI of the first publication: 10.1017/S1431927618015763
Link to this record: hdl:20.500.11880/28140
http://dx.doi.org/10.22028/D291-29265
ISSN: 1431-9276
1435-8115
Date of registration: 21-Oct-2019
Faculty: NT - Naturwissenschaftlich- Technische Fakultät
Department: NT - Physik
Professorship: NT - Keiner Professur zugeordnet
Collections:UniBib – Die Universitätsbibliographie

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