Please use this identifier to cite or link to this item:
doi:10.22028/D291-24809 | Title: | Quantitative spectrochemical analysis of Na3AIF6, ZrSiO4 and InSb with the analytical electron microscope (TEM & SEM) |
| Author(s): | Krajewski, Thomas |
| Other involved corporations: | INM Leibniz-Institut für Neue Materialien |
| Language: | English |
| Year of Publication: | 2007 |
| OPUS Source: | Jahresbericht ... / Leibniz-Institut für Neue Materialien = Annual report ... / Leibniz Institute for New Materials. - 2006 (2007), S. 86-90 |
| SWD key words: | Analytische Elektronenmikroskopie |
| DDC notations: | 530 Physics |
| Publikation type: | Journal Article |
| Link to this record: | urn:nbn:de:bsz:291-scidok-34647 hdl:20.500.11880/24865 http://dx.doi.org/10.22028/D291-24809 |
| Date of registration: | 7-Apr-2011 |
| Faculty: | SE - Sonstige Einrichtungen |
| Department: | SE - INM Leibniz-Institut für Neue Materialien |
| Collections: | INM SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
Files for this record:
| File | Description | Size | Format | |
|---|---|---|---|---|
| inm200758.pdf | 209,23 kB | Adobe PDF | View/Open |
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