Please use this identifier to cite or link to this item: doi:10.22028/D291-24809
Title: Quantitative spectrochemical analysis of Na3AIF6, ZrSiO4 and InSb with the analytical electron microscope (TEM & SEM)
Author(s): Krajewski, Thomas
Other involved corporations: INM Leibniz-Institut für Neue Materialien
Language: English
Year of Publication: 2007
OPUS Source: Jahresbericht ... / Leibniz-Institut für Neue Materialien = Annual report ... / Leibniz Institute for New Materials. - 2006 (2007), S. 86-90
SWD key words: Analytische Elektronenmikroskopie
DDC notations: 530 Physics
Publikation type: Journal Article
Link to this record: urn:nbn:de:bsz:291-scidok-34647
Date of registration: 7-Apr-2011
Faculty: SE - Sonstige Einrichtungen
Department: SE - INM Leibniz-Institut für Neue Materialien
SciDok - Der Wissenschaftsserver der Universität des Saarlandes

Files for this record:
File Description SizeFormat 
inm200758.pdf209,23 kBAdobe PDFView/Open

Items in SciDok are protected by copyright, with all rights reserved, unless otherwise indicated.