Please use this identifier to cite or link to this item:
doi:10.22028/D291-24796 | Title: | Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr |
| Author(s): | Egberts, Philip Bennewitz, Roland |
| Other involved corporations: | INM Leibniz-Institut für Neue Materialien |
| Language: | English |
| Year of Publication: | 2009 |
| OPUS Source: | Jahresbericht ... / Leibniz-Institut für Neue Materialien = Annual report ... / Leibniz Institute for New Materials. - 2008 (2009), S. 33-37 |
| SWD key words: | Versetzung <Kristallographie> Mikroskopie |
| DDC notations: | 620 Engineering and machine engineering |
| Publikation type: | Journal Article |
| Link to this record: | urn:nbn:de:bsz:291-scidok-34490 hdl:20.500.11880/24852 http://dx.doi.org/10.22028/D291-24796 |
| Date of registration: | 23-Mar-2011 |
| Faculty: | SE - Sonstige Einrichtungen |
| Department: | SE - INM Leibniz-Institut für Neue Materialien |
| Collections: | INM SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
Files for this record:
| File | Description | Size | Format | |
|---|---|---|---|---|
| inm200940.pdf | 164,87 kB | Adobe PDF | View/Open |
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