Please use this identifier to cite or link to this item: doi:10.22028/D291-24796
Title: Kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr
Author(s): Egberts, Philip
Bennewitz, Roland
Other involved corporations: INM Leibniz-Institut für Neue Materialien
Language: English
Year of Publication: 2009
OPUS Source: Jahresbericht ... / Leibniz-Institut für Neue Materialien = Annual report ... / Leibniz Institute for New Materials. - 2008 (2009), S. 33-37
SWD key words: Versetzung <Kristallographie>
DDC notations: 620 Engineering and machine engineering
Publikation type: Journal Article
Link to this record: urn:nbn:de:bsz:291-scidok-34490
Date of registration: 23-Mar-2011
Faculty: SE - Sonstige Einrichtungen
Department: SE - INM Leibniz-Institut für Neue Materialien
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