Please use this identifier to cite or link to this item: doi:10.22028/D291-24148
Title: Characterization of sol-gel thin films of TiO2-PbO, TiO2-Bi2O3 and TiO2-CeO2 compositions
Author(s): Aegerter, Michel A.
La Serra, Eliane R.
Martins Rodrigues, Ana Candida
Kordas, George
Moore, Glenn
Language: English
Year of Publication: 1990
OPUS Source: Sol-gel optics : 11 - 13 July 1990, San Diego, California / John D. Mackenzie... ed. - Bellingham, Wash. : SPIE, 1990. - (SPIE proceedings series ; 1328), S.391-414
SWD key words: Einfachschichtpotenzial
Sol-Gel-Verfahren
Mehrschichtleiterplatte
Mehrschichtsystem
Dünne Schicht
Tauchbeschichten
Röntgendiffraktometrie
DDC notations: 500 Science
Publikation type: Conference Paper
Abstract: Single and multilayer sol-gel thin films of TiO2-PbO, TiO2-Bi2O3 and TiO2-CeO2 composition were deposited on glasses using the dip coating technique. The precursors included Ti(OPr(i))4 chemically modified by acetyl acetone and diluted in Pr(i)OH and sols of Pb(OAc)2, Bi(NO3)3 5H2O diluted in acetic acid. The TiO2-CeO2 sol was prepared by mixing Ce(NH4)2(NO3)6 in ethanol and then adding Ti(O-iso-C3H7)4. Structure texture and homogeneity of their main constituents was established by XRD, XPS, SIMS and SEM-EDX techniques as a function of heat treatments.
Link to this record: urn:nbn:de:bsz:291-scidok-23059
hdl:20.500.11880/24204
http://dx.doi.org/10.22028/D291-24148
Date of registration: 20-Aug-2009
Faculty: SE - Sonstige Einrichtungen
Department: SE - INM Leibniz-Institut für Neue Materialien
Collections:INM
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