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doi:10.22028/D291-24062 | Title: | Photothermal deflection spectroscopy for ultra trace analysis of cobalt and copper ions |
| Author(s): | De Paula, Mauro H. Aegerter, Michel A. |
| Language: | English |
| Year of Publication: | 1986 |
| OPUS Source: | Analytical letters. - 19. 1986, 3/4, S. 251-265 |
| SWD key words: | Spurenanalyse Optothermische Spektroskopie Cobalt Kupfer |
| DDC notations: | 500 Science |
| Publikation type: | Journal Article |
| Abstract: | Photothermal deflection spectroscopy was applied for the abs. detn. At room temp. of ultra trace concn. of Co and Cu ions in aq. soln. The samples were prepd. by percolating 2 L of soln. prepd. from Merck Titrisol Stds. in 200 mg Merck-I cation-exchange resin. With the present exptl. conditions, the detection limit is 20 ppb for Cu and 200 ppb for Co ions within an overall accuracy of 5%. The response of the spectrometer was calibrated by using the inductively coupled plasma technique. |
| Link to this record: | urn:nbn:de:bsz:291-scidok-22624 hdl:20.500.11880/24118 http://dx.doi.org/10.22028/D291-24062 |
| Date of registration: | 3-Jul-2009 |
| Faculty: | SE - Sonstige Einrichtungen |
| Department: | SE - INM Leibniz-Institut für Neue Materialien |
| Collections: | INM SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| aeg080.pdf | 370,26 kB | Adobe PDF | View/Open |
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