Please use this identifier to cite or link to this item: doi:10.22028/D291-24062
Title: Photothermal deflection spectroscopy for ultra trace analysis of cobalt and copper ions
Author(s): De Paula, Mauro H.
Aegerter, Michel A.
Language: English
Year of Publication: 1986
OPUS Source: Analytical letters. - 19. 1986, 3/4, S. 251-265
SWD key words: Spurenanalyse
Optothermische Spektroskopie
DDC notations: 500 Science
Publikation type: Journal Article
Abstract: Photothermal deflection spectroscopy was applied for the abs. detn. At room temp. of ultra trace concn. of Co and Cu ions in aq. soln. The samples were prepd. by percolating 2 L of soln. prepd. from Merck Titrisol Stds. in 200 mg Merck-I cation-exchange resin. With the present exptl. conditions, the detection limit is 20 ppb for Cu and 200 ppb for Co ions within an overall accuracy of 5%. The response of the spectrometer was calibrated by using the inductively coupled plasma technique.
Link to this record: urn:nbn:de:bsz:291-scidok-22624
Date of registration: 3-Jul-2009
Faculty: SE - Sonstige Einrichtungen
Department: SE - INM Leibniz-Institut für Neue Materialien
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