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doi:10.22028/D291-38235
Titel: | A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries Research |
VerfasserIn: | Cressa, Luca Fell, Jonas Pauly, Christoph Hoang, Quang Hung Mücklich, Frank Herrmann, Hans-Georg Wirtz, Tom Eswara, Santhana |
Sprache: | Englisch |
Titel: | Microscopy and Microanalysis |
Bandnummer: | 28 |
Heft: | 6 |
Seiten: | 1890 - 1895 |
Verlag/Plattform: | Cambridge University Press |
Erscheinungsjahr: | 2022 |
Freie Schlagwörter: | battery material composite cathode correlative microscopy elemental mapping nanoCT SIMS SEM |
DDC-Sachgruppe: | 500 Naturwissenschaften |
Dokumenttyp: | Journalartikel / Zeitschriftenartikel |
Abstract: | Correlative microscopy approaches are attracting considerable interest in several research fields such as materials and battery research. Recent developments regarding X-ray computer tomography have made this technique available in a compact module for scanning electron microscopes (SEMs). Nano-computed tomography (nanoCT) allows morphological analysis of samples in a nondestructive way and to generate 2D and 3D overviews. However, morphological analysis alone is not sufficient for advanced studies, and to draw conclusions beyond morphology, chemical analysis is needed. While conventional SEM-based chemical analysis techniques such as energy-dispersive X-ray spectroscopy (EDS) are adequate in many cases, they are not well suited for the analysis of trace elements and low-Z elements such as hydrogen or lithium. Furthermore, the large information depth in typical SEM-EDS imaging conditions limits the lateral resolution to micrometer length scales. In contrast, secondary ion mass spectrometry (SIMS) can perform elemental mapping with good surface sensitivity, nanoscale lateral resolution, and the possibility to analyze even low-Z elements and isotopes. In this study, we demonstrate the feasibility and compatibility of a novel FIB-SEM-based correlative nanoCT-SIMS imaging approach to correlate morphological and chemical data of the exact same sample volume, using a cathode material of a commercial lithium battery as an example. |
DOI der Erstveröffentlichung: | 10.1017/S1431927622012405 |
URL der Erstveröffentlichung: | https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/fibsem-based-correlative-methodology-for-xray-nanotomography-and-secondary-ion-mass-spectrometry-an-application-example-in-lithium-batteries-research/168E6A51EFBF18C2003DC45E037114A2#article |
Link zu diesem Datensatz: | urn:nbn:de:bsz:291--ds-382351 hdl:20.500.11880/34514 http://dx.doi.org/10.22028/D291-38235 |
ISSN: | 1431-9276 1435-8115 |
Datum des Eintrags: | 25-Nov-2022 |
Fakultät: | NT - Naturwissenschaftlich- Technische Fakultät |
Fachrichtung: | NT - Materialwissenschaft und Werkstofftechnik |
Professur: | NT - Prof. Dr. Frank Mücklich |
Sammlung: | SciDok - Der Wissenschaftsserver der Universität des Saarlandes |
Dateien zu diesem Datensatz:
Datei | Beschreibung | Größe | Format | |
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a-fib-sem-based-correlative-methodology-for-x-ray-nanotomography-and-secondary-ion-mass-spectrometry-an-application-example-in-lithium-batteries-research.pdf | 511,47 kB | Adobe PDF | Öffnen/Anzeigen |
Diese Ressource wurde unter folgender Copyright-Bestimmung veröffentlicht: Lizenz von Creative Commons