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Titel: A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries Research
VerfasserIn: Cressa, Luca
Fell, Jonas
Pauly, Christoph
Hoang, Quang Hung
Mücklich, Frank
Herrmann, Hans-Georg
Wirtz, Tom
Eswara, Santhana
Sprache: Englisch
Titel: Microscopy and Microanalysis
Bandnummer: 28
Heft: 6
Seiten: 1890 - 1895
Verlag/Plattform: Cambridge University Press
Erscheinungsjahr: 2022
Freie Schlagwörter: battery material
composite cathode
correlative microscopy
elemental mapping
nanoCT
SIMS
SEM
DDC-Sachgruppe: 500 Naturwissenschaften
Dokumenttyp: Journalartikel / Zeitschriftenartikel
Abstract: Correlative microscopy approaches are attracting considerable interest in several research fields such as materials and battery research. Recent developments regarding X-ray computer tomography have made this technique available in a compact module for scanning electron microscopes (SEMs). Nano-computed tomography (nanoCT) allows morphological analysis of samples in a nondestructive way and to generate 2D and 3D overviews. However, morphological analysis alone is not sufficient for advanced studies, and to draw conclusions beyond morphology, chemical analysis is needed. While conventional SEM-based chemical analysis techniques such as energy-dispersive X-ray spectroscopy (EDS) are adequate in many cases, they are not well suited for the analysis of trace elements and low-Z elements such as hydrogen or lithium. Furthermore, the large information depth in typical SEM-EDS imaging conditions limits the lateral resolution to micrometer length scales. In contrast, secondary ion mass spectrometry (SIMS) can perform elemental mapping with good surface sensitivity, nanoscale lateral resolution, and the possibility to analyze even low-Z elements and isotopes. In this study, we demonstrate the feasibility and compatibility of a novel FIB-SEM-based correlative nanoCT-SIMS imaging approach to correlate morphological and chemical data of the exact same sample volume, using a cathode material of a commercial lithium battery as an example.
DOI der Erstveröffentlichung: 10.1017/S1431927622012405
URL der Erstveröffentlichung: https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/fibsem-based-correlative-methodology-for-xray-nanotomography-and-secondary-ion-mass-spectrometry-an-application-example-in-lithium-batteries-research/168E6A51EFBF18C2003DC45E037114A2#article
Link zu diesem Datensatz: urn:nbn:de:bsz:291--ds-382351
hdl:20.500.11880/34514
http://dx.doi.org/10.22028/D291-38235
ISSN: 1431-9276
1435-8115
Datum des Eintrags: 25-Nov-2022
Fakultät: NT - Naturwissenschaftlich- Technische Fakultät
Fachrichtung: NT - Materialwissenschaft und Werkstofftechnik
Professur: NT - Prof. Dr. Frank Mücklich
Sammlung:SciDok - Der Wissenschaftsserver der Universität des Saarlandes



Diese Ressource wurde unter folgender Copyright-Bestimmung veröffentlicht: Lizenz von Creative Commons Creative Commons