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Results 1-10 of 36 (Search time: 0.002 seconds).
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Year of PublicationTitleAuthor(s)Open Access
1993Dispersion strengthening of Al films by oxygen ion implantationBader, S.; Flinn, P. A.; Arzt, Eduard; Nix, William D.
1994Detailed study of electromigration induced damage in Al and AlCuSi interconnectsMöckl, U. E.; Bauer, M.; Kraft, Oliver; Sanchez, J. E.; Arzt, Eduard
1986High temperature low cycle fatigue of inconel MA 6000Bressers, J.; Arzt, Eduard
1987The mechanisms of dispersion strengthening in high temperature alloysArzt, Eduard; Rösler, Joachim; Schröder, J. H.
1986Prediction of HIP parametersAslan, Mesut; Kaysser, Wolfgang A.; Arzt, Eduard; Petzow, Günther
2011Expositionen in der chemischen Nanotechnologie — eine Analyse klinischer und diagnostischer BefundeMittmann-Frank, Michaela; Berger, Hendrik; Pföhler, Claudia; Bücker, Arno; Wilkens, Heinrike; Arzt, Eduard; Schmitt, Karl-Peter; Wennemuth, Gunther; Schneider, Joachim; Buchter, Axel
1988Elektronenmikroskopische Untersuchungen an dispersionsgehärteten SuperlegierungenSchröder, J. H.; Arzt, Eduard
1993Influence of coarse second phase additions on mechanical properties of NiAlClemens, Helmut; Rumberg, I.; Schretter, P.; Grahle, Peter; Lang, O.; Wanner, Alexander; Arzt, Eduard
1993Observation and modeling of electromigration-induced void growth in Al-based interconnectsKraft, Oliver; Bader, S.; Sanchez, J. E.; Arzt, Eduard
19901300-K compressive properties of a reaction milled NiAl-AlN compositeWhittenberger, J. Daniel; Arzt, Eduard; Luton, Michael J.