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Title: Atomic Force Microscopy Study of Discrete Dislocation Pile-ups at Grain Boundaries in Bi-Crystalline Micro-Pillars
Author(s): Chen, Xiaolei
Richeton, Thiebaud
Motz, Christian
Berbenni, Stéphane
Language: English
Title: Crystals
Volume: 10
Issue: 5
Publisher/Platform: MDPI
Year of Publication: 2020
Free key words: micromechanical testing
discrete dislocation pile-up
grain boundary
free surface
anisotropic elasticity
crystallographic slip
DDC notations: 600 Technology
Publikation type: Journal Article
Abstract: Compression tests at low strains were performed to theoretically analyze the effects of anisotropic elasticity, misorientation, grain boundary (GB) stiffness, interfacial dislocations, free surfaces, and critical force on dislocation pile-ups in micro-sized Face-Centered Cubic (FCC) Nickel (Ni) and α -Brass bi-crystals. The spatial variations of slip heights due to localized slip bands terminating at GB were measured by Atomic Force Microscopy (AFM) to determine the Burgers vector distributions in the dislocation pile-ups. These distributions were then simulated by discrete pile-up micromechanical calculations in anisotropic bi-crystals consistent with the experimentally measured material parameters. The computations were based on the image decomposition method considering the effects of interphase GB and free surfaces in multilayered materials. For Ni and α -Brass, it was found that the best predicted step height spatial profiles were obtained considering anisotropic elasticity, free surface effects, a homogeneous external stress and a certain critical force in the material to equilibrate the dislocation pile-ups.
DOI of the first publication: 10.3390/cryst10050411
Link to this record: urn:nbn:de:bsz:291--ds-310502
ISSN: 2073-4352
Date of registration: 10-Jun-2020
Faculty: NT - Naturwissenschaftlich- Technische Fakultät
Department: NT - Materialwissenschaft und Werkstofftechnik
Professorship: NT - Prof. Dr. Christian Motz
Collections:SciDok - Der Wissenschaftsserver der Universität des Saarlandes

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