Please use this identifier to cite or link to this item: doi:10.22028/D291-29254
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Title: Low-force spectroscopy on graphene membranes by scanning tunneling microscopy
Author(s): Uder, Bernd
Gao, Haibin
Kunnas, Peter
de Jonge, Niels
Hartmann, Uwe
Language: English
Title: Nanoscale
Volume: 10
Issue: 4
Startpage: 2148
Endpage: 2153
Publisher/Platform: Royal Society of Chemistry (RSC)
Year of Publication: 2018
Publikation type: Journal Article
Abstract: Two-dimensional atomically flat sheets with a high mechanical flexibility are very attractive as ultrathin membranes but are also inherently challenging for microscopic investigations. We report on a method using Scanning Tunneling Microscopy (STM) under ultra-high vacuum conditions for non-indenting low-force spectroscopy on micrometer-sized freestanding graphene membranes. The method is based on applying quasi-static voltage ramps with active feedback at low tunneling currents and ultimately relies on the attractive electrostatic force between the tip and the membrane. As a result a bulge-test scenario can be established. The convenience and simplicity of the method relies on the fact that the loading force and the membrane deflection detection are both provided simultaneously by the STM. This permits the continuous measurement of the stress–strain relation. Electrostatic forces applied are typically below 1 nN and the membrane deflection is detected at sub-nanometer resolution. Experiments on single-layer graphene membranes with a strain of 0.1% reveal a two-dimensional elastic modulus E2D = 220 N m−1.
DOI of the first publication: 10.1039/C7NR07300C
Link to this record: hdl:20.500.11880/28109
ISSN: 2040-3364
Date of registration: 15-Oct-2019
Faculty: NT - Naturwissenschaftlich- Technische Fakultät
Department: NT - Physik
Professorship: NT - Keiner Professur zugeordnet
Collections:UniBib – Die Universitätsbibliographie

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