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|Title:||A microstructural zone model for the morphology of sol-gel coatings|
Aegerter, Michel A.
|Year of Publication:||2004|
|OPUS Source:||Journal of sol-gel science and technology. - 31. 2004, 1-3, S. 235-239|
|SWD key words:||Röntgenbeugung|
|DDC notations:||620 Engineering and machine engineering|
|Publikation type:||Journal Article|
|Abstract:||The thickness and the morphology of dip-coated single sol-gel layers is easily controlled by varying the sol compositions and the deposition parameters. A thorough study of the microstructure of transparent conducting ZnO: Al coatings deposited on fused silica substrates using X-ray diffraction, X-ray reflectometry and transmission electron microscopy cross-sections as well as of In2O3: Sn, SnO2: Sb, ZnO and TiO2 coatings reported in the literature shows that three basic morphologies can be observed: granular, layered and columnar. In multilayer systems they were found to depend essentially on the single layer thickness (SLT) and on the crystallite size determined from the data of thick films, a parameter called the "intrinsic crystallite size (ICS)". All the results so far analysed are in agreement with a 3-zone model when ICS is plotted against SLT or in a more refined version when q = ICS/SLT is plotted against the homologous temperature T-sintering/T-melting. Comparison with the Movchan-Demchishin and Polley-Carter models proposed for PVD and CVD coatings, respectively, is presented.|
|Link to this record:||urn:nbn:de:bsz:291-scidok-25312|
|Date of registration:||22-Dec-2009|
|Faculty:||SE - Sonstige Einrichtungen|
|Department:||SE - INM Leibniz-Institut für Neue Materialien|
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