Please use this identifier to cite or link to this item: doi:10.22028/D291-24129
Title: Dielectric measurements of silica aerogels
Author(s): Dos Santos, Dayse Iara
Ziemath, Ervino C.
Silva, A. A.
Basso, H. C.
Aegerter, Michel A.
Language: English
Year of Publication: 1987
OPUS Source: Crystal lattice defects and amorphous materials. - 15. 1987, S. 381-385
SWD key words: Messwert
DDC notations: 500 Science
Publikation type: Journal Article
Abstract: The dielectric response of aerogels of silica is measured down to 1.7 K and compared to a theoretical calculation using the Looyenga's relation applied to two different model structures. Helium atoms start to condense on the pore walls at T — 13K and fill them at the liquefaction temperature. A drop of the dielectric constant accompanied by a large loss peak is observed near 35K. The origin of the absorption lies in a thermally activated relaxation process and is probably due to a large number of structural defects similar to those proposed for bulk silica.
Link to this record: urn:nbn:de:bsz:291-scidok-22721
Date of registration: 6-Aug-2009
Faculty: SE - Sonstige Einrichtungen
Department: SE - INM Leibniz-Institut für Neue Materialien
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