@conferenceObjectPart{OhsakiAegerterShichiri_1990,
title={Electron diffraction analysis of the structure of SiO2 gel-film},
author={Ohsaki, Hisashi and Aegerter, Michel A. and Shichiri, Takaki},
isbn={1-558-99069-0},
doi={http://dx.doi.org/10.22028/D291-24126},
year={1990}
}