@article{OhsakiMiuraImaiTadaAegerter_1994, title={Structural analysis of SiO2 gel films by high energy electron diffraction}, author={Ohsaki, Hisashi and Miura, K. and Imai, A. and Tada, Masato and Aegerter, Michel A.}, doi={http://dx.doi.org/10.22028/D291-24106}, year={1994} }