@conferenceObjectPart{KraftBaderSanchezArzt_1993,
title={Observation and modeling of electromigration-induced void growth in Al-based interconnects},
author={Kraft, Oliver and Bader, S. and Sanchez, J. E. and Arzt, Eduard},
isbn={1-558-99205-7},
doi={http://dx.doi.org/10.22028/D291-24012},
year={1993}
}