@conferenceObjectPart{KraftSanchezArzt_1992,
title={Quantitative analysis of electromigration-induced damage in Al-based interconnects},
author={Kraft, Oliver and Sanchez, J. E. and Arzt, Eduard},
isbn={1-558-99160-3},
doi={http://dx.doi.org/10.22028/D291-23833},
year={1992}
}